Author | Jayanthy, S. author. Author. http://id.loc.gov/vocabulary/relators/aut |
---|---|
Title | Test Generation of Crosstalk Delay Faults in VLSI Circuits [electronic resource] / by S. Jayanthy, M.C. Bhuvaneswari |
Imprint | Singapore : Springer Singapore : Imprint: Springer, 2019 |
Connect to | https://doi.org/10.1007/978-981-13-2493-2 |
Descript | XI, 156 p. 49 illus., 7 illus. in color. online resource |
Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits