Title | Stochastic Processes and their Applications [electronic resource] : Proceedings of the Symposium held in honour of Professor S.K. Srinivasan at the Indian Institute of Technology Bombay, India, December 27-30, 1990 / edited by M. J. Beckmann, M. N. Gopalan, R. Subramanian |
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Imprint | Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1991 |
Connect to | http://dx.doi.org/10.1007/978-3-642-58201-1 |
Descript | XLI, 292 p. 1 illus. online resource |
1. Stochastic Theory -- The Square Wave Spectrum of a Markov Renewal Process -- Simulation and Estimation Procedures for Stress Release Models -- 2. Physics -- Positive Definite Functions in Quantum Mechanics and in Turbulence -- Population Monitoring and the Quantum Input-Output Formalism -- An Application of the Kalman Filter in Geoastronomy -- Conformai Martingales in Stochastic Mechanics -- Probability Distributions Over Noncommuting Variables -- Stochastic Quantum Mechanics -- 3. Biology -- A New Approach to the Solution of Neurological Models: Application to the Hodgkin-Huxley and the Fitzhugh-Nagumo Equations -- Neuronal Variability: Stochasticity or Chaos? -- A Limit Theorem and Asymptotical Statistical Characteristics for a Selective Interaction Model of a Single Neuron -- Phase Dependent Population Growth Models -- 4. Operations Research -- The Optimal Investment Process in German Industry -- Incentives and Regulation in Queues -- Two Models of Brand Switching -- Stochastic Processes: Use and Limitations in Reliability Theory -- Stochastic Processes and Optimization Problems in Assemblage Systems -- A Software Package Tool for Markovian Computing Models with Many States: Principles and its Applications -- Reliability Assessment Measurement for Redundant Software Systems -- A Lost Sales Inventory System with Multiple Reorder Levels -- Queueing Models in Hierarchical Planning Systems -- Reliability Analysis of a Complex System Using Boolean Function Technique -- The Second Moment of the Markovian Reward Process -- Correlation Functions in Reliability Theory