Author | Bateson, John. author |
---|---|
Title | In-Circuit Testing [electronic resource] / by John Bateson |
Imprint | Dordrecht : Springer Netherlands, 1985 |
Connect to | http://dx.doi.org/10.1007/978-94-011-7009-3 |
Descript | XX, 244 p. online resource |
1. Understanding the Production Fault Sources -- 1.1. Component Fault Sources -- 1.2. Manufacturing Fault Sources -- 1.3. Performance Fault Sources -- 1.4. Manufacturability -- 1.5. PCB Fault Spectrum -- 1.6. Defective PCB Investigation -- 1.7. Future Fault Distribution -- 2. Automatic Test Equipment for Production Test -- 2.1. In-House Test Systems -- 2.2. Commercial Testers -- 2.3. Loaded-Board Testing Trends -- 2.4. Testerโs Fault Coverage -- 2.5. Fault Coverage and Test Programming -- 2.6. Test Diagnostics -- 2.7. Unverifiable Faults -- 2.8. Failures at System Test -- 2.9. Cost of Testing -- 3. Production PCB Test System Comparison -- 3.1. In-Circuit and Functional Board Tester Comparison -- 3.2. In Circuit and Functional Board Tester Summary -- 3.3. Comparison of In-Circuit Tester, In-Circuit Analyzer, and Loaded-Board Shorts Tester -- 3.4. In-Circuit Tester, In-Circuit Analyzer, and Loaded-Board Shorts Tester Summary -- 3.5. Low-Cost ATE -- 4. PCB Production Test Strategies -- 4.1. Test Strategies -- 4.2. Medium-Volume Test Strategy -- 4.3. High-Volume Test Strategy -- 4.4. PCB Test Strategy Evaluation -- 5. The Rework Station and Networking -- 5.1. The Rework Station -- 5.2. Rework Effectiveness -- 5.3. Paperless Repair System -- 5.4. Computer-Aided Repair -- 5.5. Networking -- 5.6. Test Area Management System -- 6. In-Circuit Testing Philosophy -- 6.1. UUT Fixture Verification -- 6.2. Shorts Opens Test -- 6.3. Analog Measurement -- 6.4. Analog Testing -- 6.5. Operational Amplifiers -- 6.6. Analog Testing Summary -- 6.7. Device Orientation -- 6.8. Digital Testing -- 6.9. Test Program Preparation -- 6.10. IEEE-488 Instrumentation -- 7. In-Circuit Tester -- 7.1. Computer Subsystem -- 7.2. Switching and Measurement Subsystem -- 7.3. UUT Interface Subsystem -- 7.4. Generic In-Circuit Tester -- 7.5. Operating Software -- 7.6. Test Executive -- 7.7. Test Programming -- 7.8. Test Programming Station -- 7.9. Bare-Board Shorts and Continuity Tester -- 7.10. Test Fixture Systems -- 7.11. PCB Layout Guidelines for Testability -- 8. In-Circuit Testers for Service and Repair -- 8.1. Service Repair Strategies -- 8.2. Service Problems -- 8.3. Board Float -- 8.4. Board Mix -- 8.5. Fault Spectrum -- 8.6. PCB Population -- 8.7. Test Requirements -- 8.8. Capital Expenditure -- 8.9. Service ATE Requirements -- 8.10. Functional and In-Circuit Comparison -- 8.11. Functional and In-Circuit Summary -- 8.12. Generic Service In-Circuit Tester -- 9. In-Circuit Tester Evaluation -- 9.1. Preparation for Vendor Investigation -- 9.2. Company Evaluation -- 9.3. Test Program Software -- 9.4. Operating System Software -- 9.5. Test System Hardware -- 9.6. Vendor Support -- 9.7. Ratio Evaluation -- 10. Financial Justification -- 10.1. Production In-Circuit Tester -- 10.2. Service In-Circuit Tester -- References