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TitleHandbook of surface and interface analysis [electronic resource] : methods for problem-solving / edited by John C. Riviโaere, Sverre Myhra
Imprint Boca Raton : CRC Press, c2009
Edition 2nd ed
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Descript xx, 651 p., [8] p. of plates : ill. (some col.)


ch. 1. Introduction / John C. Riviโaere -- ch. 2. Problem solving : strategy, tactics, and resources / Sverre Myhra and John C. Riviโaere -- ch. 3. Photoelectron spectroscopy (XPS and UPS), Auger electron spectroscopy (AES), and ion scattering spectroscopy (ISS) / Vaneica Y. Young and Gar B. Hoflund -- ch. 4. Ion beam techniques : time-of-flight secondary ion mass spectrometry (ToF-SIMS) / Birgit Hagenhoff, Reinhard Kerstign, and Derk Rading -- ch. 5. Surface and interface analysis by scanning probe microscopy / Sverre Myhra -- ch. 6. Transmission electron microscopy : instrumentation, imaging modes, and analytical attachments / John M. Titchmarsh -- ch. 7. Synchrotron-based techniques / Andrea R. Gerson, David J. Cookson, and Kevin C. Prince-- ch. 8. Quantification of surface and near-surface composition by AES and XPS / Sven Tougaard --

Surfaces (Physics) -- Analysis Interfaces (Physical sciences) -- Analysis Surface chemistry Surfaces (Technology) -- Analysis Electronic books.


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