Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell

Author	Czanderna, Alvin W.
Title	Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell
Imprint	Boston, MA : Kluwer Academic Publishers, 2002
Connect to	http://dx.doi.org/10.1007/b119182
Descript	-

Chemistry Optical and Electronic Materials Characterization and Evaluation Materials Analytical Chemistry

Location

Office of Academic Resources, Chulalongkorn University, Phayathai Rd. Pathumwan Bangkok 10330 Thailand

Tel. 0-2218-2929,
0-2218-2927 (Library Service)
0-2218-2903 (Administrative Division)
Fax. 0-2215-3617, 0-2218-2907

About Us

Social Network