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AuthorChim, Wai Kin
TitleSemiconductor device and failue analysis : using photon emission microscopy / Wai Kin Chim
Imprint Chichester : Wiley, 2000
Descript xv, 269 p. : ill

Semiconductors -- Failures Semiconductors -- Testing Semiconductors -- Microscopy Photon emission

LOCATIONCALL#STATUS
Engineering LibraryTK7871.852 C47CHECK SHELVES

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