Annual Member
| Author | Chim, Wai Kin |
|---|---|
| Title | Semiconductor device and failue analysis : using photon emission microscopy / Wai Kin Chim |
| Imprint | Chichester : Wiley, 2000 |
| Descript | xv, 269 p. : ill |
| LOCATION | CALL# | STATUS |
|---|---|---|
| Engineering Library | TK7871.852 C47 | CHECK SHELVES |
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