Author | Chim, Wai Kin |
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Title | Semiconductor device and failue analysis : using photon emission microscopy / Wai Kin Chim |
Imprint | Chichester : Wiley, 2000 |
Descript | xv, 269 p. : ill |
LOCATION | CALL# | STATUS |
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Engineering Library | TK7871.852 C47 | CHECK SHELVES |
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