Annual Member
| Author | Goodhew, Peter J |
|---|---|
| Title | Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland |
| Imprint | London ; New York : Taylor & Francis, 2001 |
| Edition | 3rd ed |
| Descript | x, 251 p. : ill. ; 24 cm |
Microscopy with light and electrons--Electrons and their interaction with the specimen--Electron diffraction--The transmission electron microscope--The scanning electron microscope--Chemical analysis in the electron microscope--Electron microscopy and other techniques
| LOCATION | CALL# | STATUS |
|---|---|---|
| Center of Excellence on Hazardous Substance Management Library | QH212.E4 G62 2001 | CHECK SHELVES |
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