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AuthorGoodhew, Peter J
TitleElectron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland
Imprint London ; New York : Taylor & Francis, 2001
Edition 3rd ed
Descript x, 251 p. : ill. ; 24 cm

CONTENT

Microscopy with light and electrons--Electrons and their interaction with the specimen--Electron diffraction--The transmission electron microscope--The scanning electron microscope--Chemical analysis in the electron microscope--Electron microscopy and other techniques


Electron microscopy

LOCATIONCALL#STATUS
Center of Excellence on Hazardous Substance Management LibraryQH212.E4 G62 2001CHECK SHELVES

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