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AuthorReed, S.J.B
TitleElectron microprobe analysis and scanning electron microscopy in geology / S.J.B. Reed
Imprint Cambridge : Cambridge University Press, 1996
Descript xii, 201 p. : ill. ; 25 cm

CONTENT

Electron-target interactions and X-ray production -- The electron-optical column -- X-ray spectrometers -- Scanning electron microscopy -- Element mapping -- Qualitative X-ray analysis -- Quantitative X-ray analysis -- Accuracy of X-ray analysis and treatment of results -- Sample preparation


Petrofabric analysis Microprobe analysis Scanning electron microscopy

LOCATIONCALL#STATUS
Science LibraryQE440 E38r 1996CHECK SHELVES
Central Library @ Chamchuri 10552.8 R326ECHECK SHELVES

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