Annual Member
| Author | Reed, S.J.B |
|---|---|
| Title | Electron microprobe analysis and scanning electron microscopy in geology / S.J.B. Reed |
| Imprint | Cambridge : Cambridge University Press, 1996 |
| Descript | xii, 201 p. : ill. ; 25 cm |
Electron-target interactions and X-ray production -- The electron-optical column -- X-ray spectrometers -- Scanning electron microscopy -- Element mapping -- Qualitative X-ray analysis -- Quantitative X-ray analysis -- Accuracy of X-ray analysis and treatment of results -- Sample preparation
| LOCATION | CALL# | STATUS |
|---|---|---|
| Science Library | QE440 E38r 1996 | CHECK SHELVES |
| Central Library @ Chamchuri 10 | 552.8 R326E | CHECK SHELVES |
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