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TitleReliability and degradation : semiconductor devices and circuits
Author edited by M.J. Howes, D.V. Morgan
Imprint Chichester : J. Wiley, c1986
Descript xii, 444 p. : ill

Semiconductors -- Reliability

LOCATIONCALL#STATUS
Engineering Library : StackTK7871.85 R4 1986CHECK SHELVES

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