| Title | New horizons in testing : latent trait test theory and computerized adaptive testing / edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.] |
|---|---|
| Imprint | New York : Academic Press, c1983 |
| Descript | xvii, 345 p. : ill. ; 24 cm |
| LOCATION | CALL# | STATUS |
|---|---|---|
| Central Library : Stack (Contact Staff) | 153.93 N532 | TEMPORARILY UNAVAILABLE |