Title | New horizons in testing : latent trait test theory and computerized adaptive testing / edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.] |
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Imprint | New York : Academic Press, c1983 |
Descript | xvii, 345 p. : ill. ; 24 cm |
LOCATION | CALL# | STATUS |
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Central Library : Stack (Contact Staff) | 153.93 N532 | CHECK SHELVES |