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TitleVLSI test principles and architectures : design for testability
Author edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Imprint Amsterdam : Elsevier/ Morgan Kaufmann Publishers, c2006
Descript xxx, 777 p. : ill. ; 25 cm

Integrated circuits -- Very large scale integration -- Testing Integrated circuits -- Very large scale integration -- Design

LOCATIONCALL#STATUS
Engineering LibraryTK7874.75 V58 2006CHECK SHELVES

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